Jeudi 30 Mars à 11h00 dans l'amphi du HUB, Dr. Baptiste GAULT (Group Leader, Max Planck Institute für Eisenforschung, Dusseldorf) donnera un séminaire intitulé : "Can atom probe tomography be useful to battery research ?".
Atom probe tomography is a burgeoning microscopy and microanalysis technique allowing for compositional mapping of solid materials with sub-nanometre resolution and sensitivity in the range of tens of parts-per-million across all elements.
In this seminar, I will go back to the basics of the technique, and discuss its performance limits. I will explain some of the limits of the technique that have prevented its use in Li-battery research so far, and how the latest developments of our understanding and in terms of instrumentation are unlocking some of these analyses. In particular, I will introduce the latest developments of the technique involving the use of cryogenic specimen preparation and transfer to broaden the field of application to e.g. frozen liquid and liquid-solid interfaces.